IEEE Nanotechnology Council
Advancing Nanotech for Humanity
IEEE

TNANO Call for Papers: Nanotechnology for Instrumentation and Measurement

TNANOBANNERTNANO CALL ON PAPERS for a Special Section on Nanotechnology for Instrumentation and Measurement:

Instrumentation and measurement are of importance when charactering, testing and employing novel devices and materials. These areas assume a particular importance at the “nano” scales in which electrical and physical quantities encounter new challenges. The proposed special section will be comprised of high impact papers with particular emphasis on the application area of instrumentation and measurement and its relation to nanotechnology.

Original research contributions and review papers, not limited to the ones presented at nanofim2015, are sought including (but not limited to) the following topics:

General and dedicated devices;

Fabrication and characterization of sensors and transducers;

Nanoimaging Signal and image processing;

Metrology, reliability and testing;

General and ad hoc instrumentation;

Nanotechnology and plasma;

Biomedical applications;

Environmental applications;

Industrial applications;

Automotive; Mechatronics;

Nanomedicine;

Light and lightning;

Nanoptics and Nanophotonics;

Packaging and Nanomaterials Networking;

Modeling;

Bio-molecular and Biotechnology;

Energy Aeronautics and aerospace.

Extended versions of accepted and presented papers at Nanofim2015 (http://nanofim2015.unisalento.it) are encouraged but they will still undergo the peer review process; authors for this Special Section are requested to expand the workshop version to contain at least 40% new material.

All manuscripts must be submitted on-line using the IEEE TNANO manuscript template and Information for Authors, via the IEEE Manuscript CentralTM found at https://mc.manuscriptcentral.com/tnano.

On submission, authors must select the “Special Issue” manuscript type instead of “Regular Paper.”

Manuscripts must focus on nanotechnology for instrumentation and measurement as reflected by technical content and references.

Deadlines: Manuscript Submission: October 1, 2015

First decision to authors: December 15, 2015

Revision due (if necessary): February 1, 2016

Final notification (acceptance/rejection): March 1, 2016

Final manuscripts due: March 30, 2016

Special section publication: 5th issue of 2016

Guest Editors: Aimé Lay-Ekuakille Università del Salento, Italy

aime.lay.ekuakille@unisalento.it

Wen J. Li City University of Hong Kong, Hong Kong

wenjli@cityu.edu.hk

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