Conferences
Nanotechnology Council Conferences
The Council periodically solicits proposals for hosting IEEE NANO and IEEE NMDC, three years in advance. A guide for proposal development can be downloaded here.
1. IEEE International Conference on Nanotechnology (IEEE-NANO) IEEE-NANO is the flagship IEEE Nanotechnology conference. The conference scope covers a wide range in nanoscience and technology. In particular, it covers nanofabrication, nanomanufacturing, nanomaerials, nanobiomedicine, nanoenergy, nanoplasmonics, nanoelectronics, nanosensors and nanoactuators, characterisation and modelling of nano structures and devices. Research in both experiments and simulation is reported. Industry is encouraged to present its research projects. IEEE-NANO is solely sponsored by the IEEE Nanotechnology Council.IEEE-NANO Proceedings portal in IEEE Xplore |
2. IEEE Nanotechnology Materials and Devices Conference (NMDC) NMDC aims to develop critical assessment of existing work and future directions in nanotechnology research including nanomaterials and fabrications, nanoelectronics, nanophotonics, devices, and integration. This conference will bring together key researchers from every sector in the nanotechnology research field, with a special focus on materials and devices. NMDC is solely sponsored by the IEEE Nanotechnology Council.NMDC Proceedings portal in IEEE Xplore |
3. IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) The IEEE-NEMS is a premier annual conference series co-sponsored by the IEEE Nanotechnology Council focusing on the promotion of advanced research areas related to MEMS, nanotechnology, and molecular technology. Nanotechnology is an important emerging field. On the other hand, MEMS is indispensable in spanning nano devices into systems. It is evident that MEMS and Nanotechnology will soon merge together and this marriage will significantly impact many industries across the globe. This conference bring together world-leading researchers in several advanced topics of MEMS and Nanotechnology to disseminate their latest research results and foster cross-disciplinary discussion. The IEEE-NEMS Conference typically attracts up to 600 attendees with participants from more than 20 countries and regions worldwide.NEMS Proceedings portal in IEEE Xplore |
4. IEEE International Conference on Nano/Molecular Medicine and Engineering (NANOMED) IEEE-NANOMED is one of the premier annual events organized and co-sponsored by the IEEE Nanotechnology Council to bring together physicians, scientists and engineers focusing on the advancement of basic and clinical research in medical and biological sciences using engineering methods related to MEMS, Nano and Molecular technologies. The conference provides a unique forum to deliver essential and advanced scientific and engineering information in the applications of MEMS/NANO/Molecular technologies in medicine and biology to its participants. Focus topics include:
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5. International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) 3M-NANO website |
6. IEEE INTERNATIONAL CONFERENCE ON “NANOMATERIALS: APPLICATIONS & PROPERTIES” (NAP) |
7. International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS) Website: http://marss-conference.org/ |
8. Nanotechnology for Instrumentation and Measurement Workshop (NANOfIM) |
9. IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS) The international conference on Design & Test of integrated micro & nano-Systems represents a scientific and technological event dedicated to integrated electronic systems which reach the nanoscale era. The interests of the conference cover all the aspects from the design to the test of micro and nano systems. DTS focuses on Systems Design & Technology, Systems Testing & Reliability, Nanotechnology and applications and VLSI IoT Devices. Website: http://www.dts-conf.org/ |
10. IEEE International Conference on Micro/Nano Sensors for AI, Healthcare, and Robotics (IEEE-NSENS) IEEE-NSENS Proceedings portal in IEEE Xplore |