A near-field cavity optomechanics readout concept has been integrated with picogram-scale probes to realize fully functional AFM detection. This allows achieving high temporal resolution (<10 ns) and picometer vertical displacement uncertainty simultaneously, breaking the trade-off between AFM measurement precision and ability to capture transient events.
Adapted with permission from Nano Lett., Article ASAP, DOI: 10.1021/acs.nanolett.7b02404. Copyright © 2017 American Chemical Society.
To read more: http://pubs.acs.org/doi/abs/10.1021/acs.nanolett.7b02404
(Contents prepared by Dr. Noelia Vico Trivino and posted by Jr-Hau (JH) He)